BIST for Analog Weenies | Analog Devices

Built-in self-test (BIST), once reserved for complex digital chips, can now be found in many devices with relatively small amounts of digital content. The move to finer line process geometries has enabled several Analog Devices data converters to include BIST functionality. For the chip manufacturer, BIST can help simplify the device characterization process by providing greater visibility into the device and can reduce manufacturing test time by allowing autonomous testing of some subset of the chip. Even larger benefits of BIST are realized at the system level when on-chip BIST functionality is incorporated into the system level design. As systems become more complex, integrating individual components with BIST, a hierarchical test strategy can be implemented, providing a powerful feature for enhancing system reliability. At the system level, BIST functionality can be used in the design phase to characterize digital interface timing between the digital processors and the data convert

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